Fundamentals of Bias Temperature Instability in MOS Transistors - Characterization Methods, Process and Materials Impact, DC and AC Modeling
- Författare
- (Edited by Souvik Mahapatra.)
- Språk
- Engelska
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| Springer India, Imprint: Springer | 2016 | Indien, New Delhi | XVI, 269 sidor. 201 illus., 67 illus. in color. online resource. | 978-81-322-2508-9 |